TABLE OF CONTENT
01     PCT PHOTOELECTRIC TEST SYSTEM
02     DEFECT ANALYSIS IN ORGANIC SEMICONDUCTOR DEVICES
03     PCT PRINCIPLE OF OPERATION
04     PCT MEASUREMENT MODES
05     TEST EXAMPLES
06     AREAS OF APPLICATION
07     BENEFITS
08     SYSTEM OVERVIEW AND CONFIGURATION
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01     GALLERY
02     FLYER
03     PUBLICATIONS
 
 
PCT PHOTOELECTRIC TEST SYSTEM
 
The PCT is a test system for spatially resolved characterization of organic semiconductors, especially organic light emitting diodes (OLEDs), organic solar cells (OPVs), and organic sensors. It can also be used for measurements on any device with photoelectric response, e.g. inorganic solar cells. Due to its high spatial resolution (< 40 µm) the PCT is ideally suited for investigations on local performance variations and for defect analysis. In addition to visualizing defects the PCT also allows first steps in the analysis of defects.